VOLTAGE DIPS AND INTERRUPTIONS TEST SYSTEMS

Voltage dips, short interruptions and voltage fluctuations are immunity tests defined by IEC 61000-4-11 standard. On order to apply these tests, you need a simulator or system complies with the standard. fluctiimmunity test is one of the EMC tests. It is sometimes Voltage dips, short interruptions and voltage fluctuations are three of the EMC tests. 

Voltage dips and interruptions test systems, with test software, make these tests easier. You are connecting EUT to the simulator and run the simulator. Tests are performed automotically. You have to monitor your EUT during the tests. 

What we offer?

We are offering IEC 61000-4-11 compliant voltage dips and interruptions test systems. 

Brief description of VIS 1700 simulator:

It can simulate the voltage dips and fluctuations occurring on the supply networks (AC and DC). Different operating modes are possible:

1. Short time interruptions 100 %: The supply network of the DUT can be interrupted in any phase position for a defined time (0.1 ms – 9980 ms). 

2. Voltage dips: Dips to 40 %, 70 % or 80 % of the nominal voltage can be simulated at a defined phase angle and time. This test requires a 2nd voltage source, which is provided by a tapped transformer with sufficient power (VIS 740)

3. Voltage fluctuations: Fluctuation to an adjustable voltage (0 – 95 % of U1). The parameters for fall time, test time and rise time (0.1 to 70 seconds each) can be set individually. No further voltage injection is necessary.

4. Inrush current measurement: The inrush current can be measured at any phase position (0 – 360°) for each test object up to a maximum of 16 A rated current (AC).